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Neutral earth fault
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<blockquote data-quote="Sidewinder" data-source="post: 473275" data-attributes="member: 9512"><p>Well, I totally disagree with both yourself [USER=8133]@Phoenix[/USER], &amp; [USER=24445]@Murdoch[/USER] on the use of LIM on certification.</p><p></p><p>It is not acceptable in the wording of BS7671, nor the IET guidance.</p><p></p><p>If there is a test that you cannot do, on a new circuit, then you cannot use LIM.</p><p></p><p>If there is a test that you cannot do on an existing circuit following modification, then you cannot use LIM, you must, use an alternative way of wording it.</p><p></p><p>I can see what you are saying [USER=8133]@Phoenix[/USER] in your earlier post, but, LIM is not acceptable, put N/A, N/V or refer to a note by all means, but not LIM, even though it is a limitation.</p><p></p><p>I get that in the real world there are limitations, but, it is how you document these that needs care.</p></blockquote><p></p>
[QUOTE="Sidewinder, post: 473275, member: 9512"] Well, I totally disagree with both yourself [USER=8133]@Phoenix[/USER], & [USER=24445]@Murdoch[/USER] on the use of LIM on certification. It is not acceptable in the wording of BS7671, nor the IET guidance. If there is a test that you cannot do, on a new circuit, then you cannot use LIM. If there is a test that you cannot do on an existing circuit following modification, then you cannot use LIM, you must, use an alternative way of wording it. I can see what you are saying [USER=8133]@Phoenix[/USER] in your earlier post, but, LIM is not acceptable, put N/A, N/V or refer to a note by all means, but not LIM, even though it is a limitation. I get that in the real world there are limitations, but, it is how you document these that needs care. [/QUOTE]
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